Publications
Extreme ultraviolet microscope characterization using photomask surface roughness Journal Article
In: Scientific Reports, vol. 10, no. 1, pp. 11673, 2020.
Quantitative differential phase contrast (DPC) microscopy with computational aberration correction Journal Article
In: Optics express, vol. 26, no. 25, pp. 32888–32899, 2018.
Aberration recovery by imaging a weak diffuser Journal Article
In: Optics express, vol. 26, no. 16, pp. 21054–21068, 2018.
Field-varying aberration recovery in EUV microscopy using mask roughness Proceedings Article
In: Computational Optical Sensing and Imaging, pp. CW2E–2, Optical Society of America 2018.
Speckle metrology for extreme ultra-violet lithography Proceedings Article
In: Extreme Ultraviolet (EUV) Lithography IX, pp. 105830T, International Society for Optics and Photonics 2018.
Off-axis aberration estimation in an EUV microscope using natural speckle Proceedings Article
In: Imaging Systems and Applications, pp. ITh1F–2, Optical Society of America 2016.
Optical transfer function characterization using a weak diffuser Proceedings Article
In: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXIII, pp. 971315, International Society for Optics and Photonics 2016.
Phase from chromatic aberrations Journal Article
In: Optics express, vol. 18, no. 22, pp. 22817–22825, 2010.