Conference papers

Conference papers

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Nalini M. Singh; Tiffany Chien; Arthur R. C. McCray; Colin Ophus; Laura Waller

A Gaussian Parameterization for Direct Atomic Structure Identification in Electron Tomography Proceedings Article

In: 2025 IEEE International Conference on Computational Photography (ICCP), pp. 1-10, 2025.

Links | BibTeX | Tags: Atomic measurements;Photography;Three-dimensional displays;Inverse problems;Transmission electron microscopy;Tomography;Atoms;Robustness;Image reconstruction;Electrons;Atomic electron tomography;Gaussian splatting