Conference papers

Conference papers

Show all

Regina Eckert; Michael Kellman; Laura Waller

Physics-based learning for measurement diversity in 3D refractive index microscopy Inproceedings

In: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII, pp. 112450X, International Society for Optics and Photonics 2020.

Links | BibTeX | Tags: 3D imaging, experimental design, learning-based, measurement diversity, phase imaging, pupil coding

Kevin Zhang; Michael Kellman; Emrah Bostan; Laura Waller

3D fluorescence deconvolution with deep priors Inproceedings

In: Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVII, pp. 112450N, International Society for Optics and Photonics 2020.

BibTeX | Tags: 3D imaging, deconvolution, fluorescence imaging, learning-based

Michael Kellman; Emrah Bostan; Michael Lustig; Laura Waller

Data-driven experimental design for computational imaging Inproceedings

In: Quantitative Phase Imaging VI, pp. 1124916, International Society for Optics and Photonics 2020.

BibTeX | Tags: experimental design, learning-based, LED array, phase imaging

Kristina Monakhova; Nick Antipa; Laura Waller

Learning for lensless mask-based imaging Inproceedings

In: Computational Optical Sensing and Imaging, pp. CTu3A–2, Optical Society of America 2019.

Links | BibTeX | Tags: diffuser, learning-based, lensless imaging, physics-based

Michael Kellman; Emrah Bostan; Michael Chen; Laura Waller

Data-driven design for Fourier ptychographic microscopy Inproceedings

In: 2019 IEEE International Conference on Computational Photography (ICCP), pp. 1–8, IEEE 2019.

Links | BibTeX | Tags: computational imaging, experimental design, high throughput, learning-based, measurement diversity, physics-based, super resolution

Stuart Sherwin; Andrew Neureuther; Patrick Naulleau

EUV mask characterization with actinic scatterometry Inproceedings

In: Ronse, Kurt G; Hendrickx, Eric; Naulleau, Patrick P; Gargini, Paolo A; Itani, Toshiro (Ed.): International Conference on Extreme Ultraviolet Lithography 2018, pp. 122 – 135, International Society for Optics and Photonics SPIE, 2018.

Links | BibTeX | Tags: EUV, learning-based, lithography, Reflectometry, Scatterometry